学术
摘 要:
为了提高集成电路的成品率，试图采用更简便有效的方法测试芯片，并获得反映电路特性的故障响应率，在进行电路功能仿真（前仿真）或电路时序仿真（后仿真）的过程中，对电路注入单故障或多故障，然后在电路存在故障的情况下，模拟电路的行为，获得电路的故障响应率。实现了一个通用的数字电路“故障响应分析”程序，他模拟电路注入故障，收集模拟结果，通过分析获取电路的故障响应率。[著者文摘]
文章出处:
《现代电子技术》-2008年31卷4期 -6-8页
栏目信息:
分 类 号:
文献标识码:
B
文章编号:
1004-373X（2008）04-006-03
Analysis of Datum Circuit Fault Response Based on Fault Injection
YU Zhenhua,JIANG Jianhui （School of Electronics and Information,Tongji University,Shanghai,200092,China）
Abstract:
To improve the yield of integrate circuit, trying to test chips with simple and effective ways and get the desired fault response rate. When emulating the function or the timing of a circuit,it injects single fault or multiple faults. Then emulating the behavior of this circuit with fault injected to get the fault response rate. In this project,it implements a general program for analysis of fault response rate of digital circuits. Using this program, we can inject the faults automatically, collect the result of emulation, then get the fault response rate.[著者文摘]
Key words:
integrated circuit; fault response rate;single fault; double faults
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