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Atomic Layer DepositionX-Ray Photoelectron SpectroscopyTransmission Electron MicroscopyFilm TransistorsThermal StabilityElectrical CharacteristicsThin FilmsScanning Electron MicroscopyThreshold VoltageDiffusion BarrierChemical Vapor DepositionIndium Tin OxideOptical PropertiesElectrical PerformancePhase Change MemoryX-Ray DiffractionCarbon NanotubesResistive Random Access MemoryInGaZnO Thin-Film TransistorSilicon
vol.4 (2015)
vol.4 (2014)
vol.3 (2014)
vol.2 (2013)
vol.1 (2012)