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The journal "X-Ray Spectrometry (XRS)" covers the theory and application of X-ray emission spectrometry and spectroscopy, such as XRF, EPMA, SEM-EDX, PIXE, SR (synchrotron radiation)-XRF, and RI (radioisotope)-XRF. X-ray absorption (XAS, XAFS, EXAFS), X-ray scattering (Compton, Raman, elastic and inelastic), X-ray diffraction (XRD), X-ray reflection/refraction, and X-ray optics are also within the scope. XRS focuses on advances in techniques, methods, and instrumentations, including data handling, fundamental X-ray parameters, X-ray sources and detection devices, and sample preparation methods.
vol.55 (2026)
vol.54 (2025)
vol.53 (2024)
vol.52 (2023)
vol.51 (2022)
vol.50 (2021)
vol.49 (2020)
vol.48 (2019)
vol.47 (2018)
vol.46 (2017)
vol.45 (2016)
vol.44 (2015)
vol.43 (2014)
vol.42 (2013)
vol.41 (2012)
vol.40 (2011)
vol.39 (2010)
vol.38 (2009)
vol.37 (2008)
vol.36 (2007)
vol.35 (2006)
vol.34 (2005)
vol.33 (2004)
vol.32 (2003)
vol.31 (2002)
vol.30 (2001)
vol.29 (2000)
vol.28 (1999)
vol.27 (1998)
vol.26 (1997)
vol.25 (1996)
vol.24 (1995)
vol.23 (1994)
vol.22 (1993)
vol.21 (1992)
vol.20 (1991)
vol.19 (1990)
vol.18 (1989)
vol.17 (1988)
vol.16 (1987)
vol.15 (1986)
vol.14 (1985)
vol.13 (1984)
vol.12 (1983)
vol.11 (1982)
vol.10 (1981)
vol.9 (1980)
vol.8 (1979)
vol.7 (1978)
vol.6 (1977)
vol.5 (1976)
vol.4 (1975)
vol.3 (1974)
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