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X-Ray Spectrometry
中科院3区 JCR:Q3 SCIE EI CA PubMed JST
The journal "X-Ray Spectrometry (XRS)" covers the theory and application of X-ray emission spectrometry and spectroscopy, such as XRF, EPMA, SEM-EDX, PIXE, SR (synchrotron radiation)-XRF, and RI (radioisotope)-XRF. X-ray absorption (XAS, XAFS, EXAFS), X-ray scattering (Compton, Raman, elastic and inelastic), X-ray diffraction (XRD), X-ray reflection/refraction, and X-ray optics are also within the scope. XRS focuses on advances in techniques, methods, and instrumentations, including data handling, fundamental X-ray parameters, X-ray sources and detection devices, and sample preparation methods.
- 主办单位： WILEY
- 出版地区： HOBOKEN
- 出版周期： 双月刊
- 别名： X-RAY SPECTROM;X-Ray Spectrom.;XRS;Xray Spectrom;X-RAY SPECTROMETRY;X-ray spectrometry : XRS;XRS: X-ray Spectrometry;X射线光谱测定
- 国际标准连续出版物号/电子版： ISSN 0049-8246 / EISSN 1097-4539
- 创刊时间： 1972年
期刊信息
- 主办单位：WILEY
- 地 址： HOBOKEN
期刊简介
The journal "X-Ray Spectrometry (XRS)" covers the theory and application of X-ray emission spectrometry and spectroscopy, such as XRF, EPMA, SEM-EDX, PIXE, SR (synchrotron radiation)-XRF, and RI (radioisotope)-XRF. X-ray absorption (XAS, XAFS, EXAFS), X-ray scattering (Compton, Raman, elastic and inelastic), X-ray diffraction (XRD), X-ray reflection/refraction, and X-ray optics are also within the scope. XRS focuses on advances in techniques, methods, and instrumentations, including data handling, fundamental X-ray parameters, X-ray sources and detection devices, and sample preparation methods.